SEMICONDUCTOR DIGEST Webinar: Advanced XRF Coatings Analysis Equipment for Semiconductor Components
Discover how advanced XRF technology is transforming quality control in semiconductor manufacturing.
As devices become smaller and more complex—driven by innovations in AI hardware, ADAS, MEMS, and next gen smartphones—the need for precise plating thickness and composition measurement has never been greater.
Hitachi High Tech’s latest XRF systems use cutting-edge polycapillary optics and high-sensitivity detection to deliver high-accuracy, non-destructive analysis of multilayer coatings, even on microscopic features and solder bumps. With beam diameters under 20 µm and exceptional measurement repeatability, these tools empower engineers and QA/QC teams to meet today’s demanding manufacturing standards with confidence.
Join us to explore how advanced XRF solutions can elevate your quality program and support next generation semiconductor development.
Date/Time
March 12, 2026, 10 AM PDT / 1 PM EDT
About the Presenter
Marty Schreck is Hitachi High-Tech America’s product specialist for their line of XRF coatings and materials analyzers. In his role, he works with customers across numerous industries to find new solutions to the challenges they face in their everyday work environment for production control, QC/QA, engineering design, and failure analysis. He has 40 years of experience working with XRF technology, holding many roles along the way.
Contact
Hitachi High-Tech America