Skip to main content

Hitachi High-Tech in Canada
  1. Home
  2. Products & Services
  3. Electron Microscopes / Atomic Force Microscopes
  4. Sample Preparation

Sample Preparation

Sample Preparation Tools for Electron Microscopes

-

Ion Sputter MC1000

An ion sputter increases the conductivity of non-conductive sample to prevent charging during electron microscope observation. MC1000 employs magnetron sputtering technology to reduce damage to the sample, and the target can be selected from among Pt, Pt-Pd, Au and Au-Pd depending on the purpose.

-

Sample Cleaner ZONESEMII

The ZONESEMII Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

-

Ion Milling System ArBlade 5000

ArBlade 5000 supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cross section width can be expanded to 8mm for applications requiring wide area milling such as electric components.

-

Sample Cleaner ZONETEM II

The innovative ZONETEM II Desktop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging. ZONE offers easy-to-use cleaning for pre-analysis sample preparation, ensuring the best possible data from your TEM samples.

Ion Milling System IM4000Plus

Ion Milling System IM4000Plus

The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.