MicroscopíaElectrónicade Barrido(SEM) y FuerzasAtómicas(AFM) workshop in Madrid

Centro Nacional de Investigaciones Metalúrgicas (CENIM)
Avda Gregorio del Amo 8, 28040 Madrid
Sala de Conferencias, edificio principal

9.00 – 9.30	Breakfast/ Coffee/ Registration
9.30 – 9.45	Introducción de Monocomp Instrumentación
9.45 – 10.30	Basics of SEM and EDX by José Alfonso Seisdedos Bayón, Director de Monocomp Instrumentación
10.30 – 11.00	Imaging surface topography: Understanding Atomic Force Microscopy(AFM) by Dr. Colin Grant, Hitachi SPM Sales & Applications Specialist
11.00 – 11.30	Coffee break
11.30 – 12.00	Hitachi’s wide varieties of SEM sample preparation methods and its applications by Mr. Yu Sugimoto Hitachi EM Sales Manager
12.00 – 12.30	Correlative Microscopy: Combined AFM & SEM for advanced materials characterisations by Dr. Colin Grant
12.30 – 13.15	Hitachi’s latest FE-SEM technology and its applications by Mr. Yu Sugimoto
13.15 – 13.30	Q&A/ Wrap-up