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Sample Preparation

Sample Preparation Tools for Electron Microscopes

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Pre-processing of Sample for TEM/SEM

Sample Preparation Tools :
Ion Milling System, Sample Cleaner, Ion Sputter

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Ion Milling System ArBlade 5000

ArBlade 5000 supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cross section width can be expanded to 8mm for applications requiring wide area milling such as electric components.

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Sample Cleaner ZONETEM II

The innovative ZONETEM II Desktop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging. ZONE offers easy-to-use cleaning for pre-analysis sample preparation, ensuring the best possible data from your TEM samples.

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