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Sample Preparation

Sample Preparation Tools for Electron Microscopes


Pre-processing of Sample for TEM/SEM

Sample Preparation Tools :
Ion Milling System, Sample Cleaner, Ion Sputter


Ion Milling System ArBlade 5000

ArBlade 5000 supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cross section width can be expanded to 8mm for applications requiring wide area milling such as electric components.


Sample Cleaner ZONETEM II

The innovative ZONETEM II Desktop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging. ZONE offers easy-to-use cleaning for pre-analysis sample preparation, ensuring the best possible data from your TEM samples.

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