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Hitachi High-Tech

The AFM5000II is a controller for scanning probe microscope control and imaging which allows topological observation and analysis of physical properties in nano-scale regions. Standard inclusion of RealTune II auto-tuning functions for measurement parameters allows acquisition of highly reproducible data.

Main Features

  1. Auto-measurement
    A new algorithm developed for prediction and adjustment of major parameters allows one-click measurement simply by pressing the start button.
  2. New GUI and analysis functions
    Overlaid display of topological and physical property images and the capability for depiction as 3D images provide a visual understanding of the distribution of physical properties.

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