Probe Station AFM5000II/Real TuneII
Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.
1. RealTuneII Auto Tuning Functions for Optimal Measurement Parameters
The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever’s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!
- One-click automatic measurement
- Automatic tuning function for various samples
Conventional tuning system
Delicate fibers are deformed and damaged in cross directions.
The complex fiber structure is clearly observed with no damage.
[Example 1] Fibrous carbon nano-tube structure
(Gecko adhesive tape, sample generously provided by Nitto Denko Corporation)
Conventional recommendation value
Crystal steps are destroyed and unclear.
A stable observation of crystal steps by the improved tuning function.
[Example 2] Polycrystalline organic thin-film transistor
(polycrystalline pentacene thin film, sample generously provided by Kitamura Laboratory, Kobe University)
2. New GUI (Graphical Use Interface)
- Intuitive and logical control icons balance the screen layout with information provided for ultra-efficient, productive, and easy AFM operation for all levels of users.
- Measurement and analysis tabs provide organized and spacious work areas on the monitor display.
3. Analysis Functions
The 3D Overlay Function enables the observation of “cause and effect relationship” between topography and physical properties. A variety of other functions, such as roughness and cross-section analysis, are also standard tools.
- Roughness and cross-section profile analysis
4. Desktop Design
Small form factor for flexible, efficient space usage.
|Compatible Units||AFM5100N, AFM5300E|
|RealTuneII||Automatic tuning of amplitude, contact force, scan speed, and feedback gains
(Various tuning modes including Auto, Fast, Soft, Rough, Flat, and Point)
|Various Functions||Operating instructions; Tab structure (Measurement/Analysis); Movable scopes/Measurement area tracking; Batch processing; and Tip calibration|
|Operating Voltage||XY(±200V/18 bit)Z(±200V/26 bit)|
|Multi Channel(Data Points)||4 channels (max. 2,048×2,048)
2 channels (max. 4,096×4,096)
|Rectangular Scan||1:1, 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1|
|Analysis Software||3D display and overlay, Roughness, Cross-section, Average cross-section|
|Power Supply||AC 100V to 240V±10%|
Article information on Hitachi technical magazine "SI NEWS"
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments. Those authors are notable researchers and Hitachi application engineers. This is an Probe Station AFM5000II/Real TuneII
Describing basic principles and multiple function principles of Scanning Tunnel Microscope (STM), Atomic Force Microscope (AFM) etc.
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.
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