Skip to main content

Hitachi High-Tech
  1. Home
  2. Knowledge
  3. Electron Microscopes/Atomic Force Microscopes
  4. Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)
  5. Principle of SPM, AFM

Principle of SPM, AFM

Principle of SPM, AFM

Scanning Probe Microscope (SPM) represents a particular family of advanced microscopy techniques that allow the simultaneous measurements of surface topography as well as a wide variety of material properties at nanometer scale.
The two key members in this family are Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM).

Schematic Diagram of SPM
Schematic Diagram of AFM
Schematic of SPM System
Schematic of AFM System

SPM Measurement Mode


Electro Magnetic Property

Products & Services

Hitachi High-Tech Social Media