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  3. Electron Microscopes/Atomic Force Microscopes
  4. Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)
  5. Principle of SPM, AFM
  6. Adhesion


It micro-oscillates the sample in the vertical direction; repeats the movement that the probe and sample contact and separate periodically; detects the deflection of the cantilever at the moment that the probe is separated from the sample; and observes adsorption power distribution.


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