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  3. Electron Microscopes/Atomic Force Microscopes
  4. Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)
  5. Principle of SPM, AFM
  6. Scanning Tunneling Microscope (STM)

Scanning Tunneling Microscope (STM)

A tunnel current flowing between probe and sample is detected (controlled so that the tunnel current is fixed and sample surface is scanned) by applying a bias voltage between a metallic probe and conductive or semiconductive sample as the distance between them approaches less than several nm. Sample topography as well as its electronic state are observed.

Image of graphite atoms
Scan area: 1.3 nm

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