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  3. Electron Microscopes/Atomic Force Microscopes
  4. Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)
  5. Principle of SPM, AFM
  6. Friction Force Microscope (FFM)

Friction Force Microscope (FFM)

The sample is scanned in the direction in which the cantilever is twisted. Frictional force, occurring between probe and sample, is converted into cantilever’s torsion which is simultaneously detected as frictional and topographic images.


Animation of FFM Observation: Silicon oil film on polystyrene


Friction distribution measurement of silicon oil film on polystyrene

Friction of oil film is less, resulting in dark contrast in FFM and LM-FFM images.
Scan area: 2.5 μm

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