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  4. Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)
  5. Principle of SPM, AFM
  6. Atomic Force Microscope (AFM) / Contac Mode

Atomic Force Microscope (AFM) / Contac Mode

For contact mode AFM, the force between probe and sample is detected and measured via cantilever’s deflection. A feedback system will maintain this deflection constant while scanning the sample surface to observe topography.

Semiconductor circuit
Scan area: 100 µm
Langmuir‐Blodgett film

Animation of AFM Observation: Langmuir‐Blodgett film

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