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  3. Electron Microscopes/Atomic Force Microscopes
  4. Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)
  5. Principle of SPM, AFM
  6. Current / Pico‐current

Current / Pico‐current

Scans in the horizontal direction with a bias voltage applied to the sample, detects the current that flows between probe and sample, and observes current distribution.


Schematic Animation of Current‐AFM Observation

VE‐AFM and Current‐AFM: CFRP (Carbon fiber reinforced plastic)


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