Skip to main content
A broad range of Transmission Electron Microscopes (TEM) and Scanning Transmission Electron Microscopes (STEM) suitable for structural and chemical characterizations of nanomaterials, semiconductors, energy technology, polymers, glassy materials, biomolecular mechanisms of disease, 3D-architecture of cells and tissues, viruses, and macromolecular complexes
HF-3300 is Hitachi's high-end FE-TEM employing high-brightness cold FE electron source and high accelerating voltage of 300kV to allow both ultrahigh resolution imaging and high-sensitivity analysis. Simultaneous STEM and SEM imaging enables observation of internal structure together with surface topography.
H-9500 is a 300kV ultrahigh resolution TEM with superior penetrating power. Its stable high voltage power supply and side entry stage enable high-throughput ultrahigh resolution imaging.
HD-2700 is a 200kV STEM with FE electron source for both high resolution imaging and high-sensitivity analysis. Simultaneous STEM and SEM imaging enables observation of internal structure together with surface topography. Large solid angle dual EDX allows high-sensitivity, high-throughput analysis. Hitachi's own aberration corrector offers atomic level ultrahigh resolution imaging and ultrahigh-sensitivity analysis with automatic aberration correction function.
HT7800 series are 120kV digital TEM with enhanced operability. High-resolution screen camera and Image Navigation function ensure comfortable digital operation in a lighted environment. HT7800 offers wide-area, high-contrast imaging while HT7830 realizes best-in-class resolution.
HT7700 is a 120kV digital TEM ready for lighted environment. Hitachi's unique dual mode objective lens allows both high contrast imaging and high resolution imaging on a single platform.
Applications of TEM (Transmission Electron Microscopes) are available on S.I.navi, Hitachi Membership Site.
“S.I.navi” is Hitachi Membership Site for analytical instruments users.
“S.I.navi” provides helpful information for daily analysis.