TEM (Transmission Electron Microscopes)
A broad range of Transmission Electron Microscopes (TEM) and Scanning Transmission Electron Microscopes (STEM) suitable for structural and chemical characterizations of nanomaterials, semiconductors, energy technology, polymers, glassy materials, biomolecular mechanisms of disease, 3D-architecture of cells and tissues, viruses, and macromolecular complexes
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Transmission Electron Microscope HF5000
Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance
0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX detector(s), all in a single objective lens configuration.
The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi's own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series.
Integrating these accumulated technologies into a new 200 kV TEM/STEM platform results in an instrument with an optimum combination of sub-Å imaging and analysis, as well as the flexibility and unique capabilities to address the most advanced studies.
Transmission Electron Microscope HT7800 Series
The HT7800 series is a 120 kV transmission electron microscope (TEM) that combines high-quality and reproducible data acquisition with improved efficiency for observation work.
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