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Ion milling, Sputter, UV cleaner

Sample Preparation Tool Lineup for Electron Microscopes

Ion Milling System ArBlade 5000

ArBlade 5000 supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cross section width can be expanded to 8mm for applications requiring wide area milling such as electric components.

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Ion Milling System IM4000Plus

IM4000Plus supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cooling unit is available for samples susceptible to deformation or melting during heat generating processing. Air protection holder prevents air exposure of reactive samples during sample transfer

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Sample Cleaner ZONETEM

ZONETEM removes hydrocarbon contamination deposited on samples by UV light irradiation and helps observe true structure of the samples. It also permits easy operation and can process multiple samples at a time.

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Ion Sputter MC1000

An ion sputter increases the conductivity of non-conductive sample to prevent charging during electron microscope observation. MC1000 employs magnetron sputtering technology to reduce damage to the sample, and the target can be selected from among Pt, Pt-Pd, Au and Au-Pd depending on the purpose.

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