Sample Preparation
Sample Preparation Tools for Electron Microscopes
Ion Sputter MC1000
An ion sputter increases the conductivity of non-conductive sample to prevent charging during electron microscope observation. MC1000 employs magnetron sputtering technology to reduce damage to the sample, and the target can be selected from among Pt, Pt-Pd, Au and Au-Pd depending on the purpose.
Sample Cleaner ZONESEM II
The ZONESEM II Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging and micrcoanalysis.
Broad Ion Beam Milling System IM4000II
The Hitachi IM4000II Ion Milling system is multifunctional to support various sample preparation needs. It supports cross-section milling, flat milling, Cooling Temperature Control, Air Protection Holders, and various other options to enable preparation of specimens across a wide range of applications.
Broad Ion Beam Milling System ArBlade 5000
The ArBlade 5000 is the top-line model of Hitachi ion milling systems. It is the most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat milling samples for electron microscopy.
Sample Cleaner ZONETEM II
The ZONETEM II Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging and micrcoanalysis. The ZONETEMII offers easy-to-use cleaning for sample grid preparation and stores up to five holders to maintain optimal cleaniness, ensuring the best data from your TEM samples.