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Electron Microscopes / Atomic Force Microscopes

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Electron Microscopes

Electron Microscopes use electron beam which has shorter wavelength than light to resolve fine structure considered too small for light microscopes. They are used in a wide variety of fields from metals/ceramics/semiconductors to polymers/biological tissues.
TEM and STEM are used to observe internal structure by detecting electrons transmitted through a thin specimen while SEM is used to observe surface structure by detecting electrons generated upon primary electron beam irradiation on the surface of a sample.


Focused Ion Beam Systems

FIB is used to observe surface structure by detecting electrons generated upon ion beam irradiation and process the surface of a sample to an arbitrary shape by the use of focused ion beam. Since the ion beam can arbitrarily scan on a sample, FIB is widely used for site-specific cross section preparation for SEM observation and lamella preparation for TEM observation. FIB-SEM incorporates both FIB and SEM in a single system, and allows in-situ SEM observation of FIB-prepared cross section. By repeating FIB milling and SEM observation, serial cross-sectional SEM images can be collected and reconstructed for further three-dimensional structural analysis of the sample.


Sample Preparation

Ion milling system to prepare wide cross section of a sample, ion sputter to increase the conductivity of non-conductive sample and sample cleaner to reduce contamination which disturb electron microscope observation.

*1 Scanning Electron Microscope

*2 Transmission Electron Microscope

*3 Scanning Transmission Electron Microscope

*4 Focused Ion Beam systems


Visit Hitachi’s electron microscopy applications labs in Germany or UK without leaving your desk thanks to the lab’s new online interactive tour. Learn more about the instruments, including descriptions, videos and links to additional information.
As well as undertaking sample runs and demonstrations, the labs also carry out research, method development and testing to develop new microscopy-based solutions together with customers.

Product Catalogue


Hitachi's 2020/21 Microscopy Product Portfolio

This new brochure provides a comprehensive overview of the wide spectrum of electron and ion beam microscopy products, offered by Hitachi.

Be inspired and identify the ideal solution for your application.

Our local European sales and product application experts will support you with detailed introductions and answer your questions.