International Symposium Testing and Failure Analysis (ISTFA) 2019

Hitachi’s Synergistic Lab Solutions for Failure Analysis (ISTFA 2019 Booth #413)

The ArBlade 5000 delivers large area, damageless surfaces easily transferrable to the Hitachi Regulus Series UHR CFE-SEM for nanoscale imaging resolution. For more precise fault isolation, electrical probing, and I-V curve diagnostics, the in-situ probing system NP6800 can be utilized. The Ethos NX5000 FIB-SEM can automate a series of areas of interest to prepare TEM lamellae for subsequent atomic scale imaging in a Cs-corrected TEM/STEM.

Hitachi’s Synergistic Failure Analysis Solutions

• At ISTFA 2019, Hitachi will feature the nano prober, Ethos FIB-SEM, ion milling, and other various tools for characterization. During the Tools of the Trade Tour, our solutions for IC sample preparation and characterization will be demonstrated.

• To register for this event: https://www.asminternational.org/web/istfa-2019

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