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The ArBlade 5000 delivers large area, damageless surfaces easily transferrable to the Hitachi Regulus Series UHR CFE-SEM for nanoscale imaging resolution. For more precise fault isolation, electrical probing, and I-V curve diagnostics, the in-situ probing system NP6800 can be utilized. The Ethos NX5000 FIB-SEM can automate a series of areas of interest to prepare TEM lamellae for subsequent atomic scale imaging in a Cs-corrected TEM/STEM.
|Dates||November 11-13, 2019|
|Location||Portland, Oregon, U.S.A.|