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Hitachi High-Tech in America

  • The Microscopy and Imaging Center (MIC) of Texas A&M University (TAMU) will be conducting a 3-day workshop on the application of Scanning Electron Microscope (SEM) in different research fields. Hitachi’s application scientist, Atsushi Muto, will speak about “Advances in SEM Imaging Techniques and Technologies” on Monday, June 10, at 1:45 PM.
Dates June 10-12, 2019
Location College Station, TX
Registration and schedule