Wednesday, 6/21/2017, 2:00 PM-2:45 PM ET
William K. Podrazky, Applications Engineer
Thinking outside the lab, Hitachi High Technologies has produced an instrument with the performance of a conventional full-sized and research-grade SEM, but with the usability and interface to appeal to the experienced and non-microscopist alike.
By combining these capabilities and characteristics into the FlexSEM 1000, it becomes readily achievable for any engineer, technologist, or technician to produce high-quality results with minimal time and operator intervention.
Robust automated imaging and navigation functions make specimen exploration simple, and generating accurate, correlative optical and electron image series can be done with just a single click.
Application examples relevant to life and materials sciences will be displayed demonstrating nanometer imaging and microanalysis resolution, including a complete instrument overview.
William K. Podrazky earned a B.S. in Materials Science & Engineering from Lehigh University and has since worked at Hitachi High Technologies America as an Applications Engineer. His primarily focus is supporting VP-SEM and Ion Milling instruments, and providing synergistic solutions which address all electron imaging and sample preparation requirements for a broad range of applications.
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