Microscopy & Microanalysis 2025 (M&M 2025)
Join us at Microscopy & Microanalysis 2025 (M&M 2025) and discover the latest innovations and technologies Hitachi offers.
Whether you are currently manufacturing or developing next generation systems, you will learn about state-of-the-art equipment and analytical techniques. Available for demonstration: Solutions of automation, mineralogy, battery development/inspection, and advanced sample preparation.
Booth Events at M&M 2025*
At M&M 2025, Hitachi High-Tech will offer a series of tutorials and presentations including Vendor Tutorial sessions. Do not miss this opportunity to learn about the latest technologies and innovation.
* Food & drink will be served. Limited capacity. First come, first served.
** Schedule and topics may change.
Monday, July 28th
 Reserve your spot |
Tutorial (5:45 PM Booth 1504) Automated Materials Analysis and High-Throughput ML with AMICS Jonathan P. Knapp, Ph.D, AMICS Product Manager & Program Director DetailsIt’s faster, smarter, and better looking than ever. Join us at M&M for the debut of AMICS 5, the newest generation of Hitachi’s Automated Material Identification and Classification System (AMICS). Join project manager Jonathan Knapp, Ph.D., to learn how AMICS 5 delivers faster, multi-modal mapping by seamlessly integrating SEM, EDS or μXRF data with high-throughput classification and machine-learning workflows. Its redesigned interface and standardized automation protocols produce large-area, high-resolution mineralogical (or material) and elemental maps with unprecedented speed and accuracy. Don’t miss this live demonstration of how AMICS 5 is redefining automated materials analysis. |
Tuesday, July 29th
 Reserve your spot |
Tutorial (5:45 PM Booth 1504) Advanced Measurement Automation with Hitachi Automated Materials Identification and Classification System (AMICS) Yuki Tani, SEM Applications Engineer DetailsJoin us to explore how the SU3800SE and SU3900SE FE-SEM series can enhance your analytical workflows with integrated automation and flexible imaging options. This presentation covers the latest updates to our automation software, highlighting practical application examples.Additionally, we will introduce new image processing functions integrated within the automation software, including binarization and target extraction, demonstrating how these advanced capabilities can further improve your SEM analyses. |
Wednesday, July 30th
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Tutorial (5:45 PM Booth 1504) Supercharge EM Analysis with Spatial Intelligence, Instant AI Segmentation, & More Nick Beavers, CEO; Jeff Knipe, Product Manager; and Tom Moyer, Sales Manager from Media Cybernetics DetailsTake your EM image analysis further with spatial intelligence tools that measure complex relationships and patterns, and AI segmentation that delivers fast, accurate results without any model training, coding, or complex setup. This session will show you how these cutting-edge technologies can accelerate workflows, minimize manual work, and sharpen the clarity of your findings—whether in research or quality control. |
Instruments Available for Demos
The following instruments will be available for private demos. Please reserve your spot in advance.
SU3900SE FE-SEM  
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SU3900 SEM 
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SU8700 UHR FE-SEM 
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NEW! TM4000III Tabletop SEM 
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First time at M&M: New! TM4000PlusIII Tabletop SEM
[The Next-Generation tabletop Microscope: TM4000III Tabletop SEM]
- Automated observation of multiple specimens and faster automatic particle analysis
- Field-of-view navigation with less noise: High-current function
Private demos are available. Reserve your spot in advance!
Dates
July 27-31, 2025
Location
Booth 1504, Salt Palace Convention Center, Salt Lake City, Utah