Preparation of superb cross sections for SEM investigations by applying Broad Ion Beam (BIB) Milling

Join us for an exclusive webinar where we’ll explore practical techniques to prepare samples for SEM imaging and analysis using Ar ion milling.

Whether you're working with traditional, heat-sensitive, or air-sensitive materials, you’ll get actionable insights into revealing the inner structure with broad Ar ion beams through surface polishing or cross-sectional milling.

We’ll outline the two key ion milling techniques—surface polishing (“flatmilling”) and direct cross-section milling—discussing their applications, advantages, and best practices. You'll also learn about optional accessories, such as multi-sample holders, cryo-cooling, and inert-gas transfer units.

In this session, you’ll discover:

• How to polish and section a wide variety of materials for optimal SEM imaging using broad Ar ion beams
• Practical methods for handling challenging samples like heat-sensitive and air-sensitive specimens.
• Tips for improving throughput with optional features like multi-sample handling.