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EEM View is a completely new concept system in the world which delivers fluorescence, reflection spectra and these images simultaneously. To make it possible, AI technology is applied to analyze data with a special algorithm*1. This measurement is possible by installing the EEM View Accessory on the F-7000 / 7100 Fluorescent Spectrophotometer.
New technology capable of capturing fluorescence and reflection images and spectra of a sample simultaneously.
- Fluorescence Spectrophotometer equipped with CMOS camera imaging system -
Uniform illumination system using an integrating sphere
Captures fluorescence and reflection images and spectra of samples simultaneously!
A spectrofluorometric microscope is an option that can be attached to the sample chamber of the existing Model F-7100 fluorescence spectrophotometer equipped with CMOS camera.
Simple mounting means just placing the sample on top of the integrating sphere!
A fluorescent reflective sheet with a microstructure to improve its visibility was measured.
Simultaneous capture of spectrum data and image
The sample is illuminated with monochromatic light at wavelengths of 360 to 700 nm and with white light. An image is captured under each illumination condition, and the fluorescence spectrum is simultaneously acquired by the fluorescence-side spectroscope. After measurement, the 3-D fluorescence spectra are displayed (excitation wavelength, fluorescence wavelength, and fluorescence intensity). An enlarged image and fluorescence and reflection spectra for each partition can be displayed using the dedicated analysis software. The reflection and fluorescence distribution of samples with in-plane nonuniformity can be captured as images and spectra.
Spectral calculation and display of each partition (fluorescence and reflection)
Separated image display (fluorescence and reflection)
Separation of a captured image into a reflected light image and a fluorescence image
A captured image was separated into a reflected light image and a fluorescence image using an image separation algorithm. The reflection image was orange and the fluorescence image was green. The separated images correspond to the reflection spectrum and fluorescence spectrum, respectively, and by summing the orange reflection image and the green fluorescence image, the sample appears yellowish. It was found that the in-plane optical characteristics (optical pattern) in the reflection image and the fluorescence image were different. When the image was enlarged, it could be seen that the microstructure of the reflecting plate had a period of about 200 μm.
|EEM View mode (Measurement mode)||Measurement of 3-D fluorescence spectrum|
|Monochromatic light imaging|
|White light imaging|
|Data processing section||Thumbnail displays|
|3-D fluorescence spectrum display (contour lines, gradation)|
|Excitation / fluorescence spectrum display|
|Image zoom function|
|Partitioned display (1×1, 2×2, 3×2, 4×4, 5×5)|
|Spectral calculation and display for each partition (fluorescence and reflection)*1|
|Separated image display (fluorescence and reflection)*1|
|Irradiation wavelength||360 to 700 nm|
|Camera||Color (RGB) CMOS sensor|
|Effective number of pixels||1920×1200 (H×V)|
|Photographable wavelengths||380 to 700 nm|
Example of configuration
|Name||P/N (Part Number)|
|F-7100 Fluorescence Spectrophotometer||5J1-0041 / 5J1-0042|
|EEM View Accessory||5J0-0570|
|Substandard light source||5J0-0135 / 5J0-0136|