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Hitachi

Analytical Systems, Electron Microscopes & Medical Systems

Probe Station

Probe microscope control station for Hitachi atomic force microscopy (AFM) products

Probe Station
AFM5000II / Real TuneII

Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.

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