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Scanning Electron Microscope FlexSEM 1000

Scanning Electron Microscope FlexSEM 1000

The FlexSEM 1000 VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides unrivaled imaging performance, even in variable-pressure environments, a feature previously only available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance.

The FlexSEM will change your view of electron microscopy!

    Overview

    The FlexSEM 1000 Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.

    Compact & High-Performance Column

    Best-in-class resolution in a compact system. The FlexSEM employs a newly designed electrical optical system with a reliability-proven high-sensitivity detector, achieving imaging at 4 nm.

    High resolution image

    The electron optics incorporate a low aberration objective lens and a unique gun bias system that allows delivery of high emission current.

    Secondary Electron (SE) Image
    Accelerating Voltage: 20 kV
    Secondary Electron (SE) Image
    Magnification: 60,000X
    Resolution: 4.0 nm

    Backscattered Electron (BSE) Image
    Accelerating Voltage: 20 kV
    Backscattered Electron (BSE) Image
    Magnification: 50,000X
    Resolution: 5.0 nm

    Ultra-Variable-Pressure Detector

    Novel low vacuum technologies enable observation of the surface of non-conductive specimens without preprocessing, across the entire pressure and accelerating voltage ranges.

    New & Improved Auto Functions

    The user interface is easy to operate even by novice users, and with the various automated functions, high-quality and quick data acquisition can be accomplished regardless of user experience level. A touch panel operation is possible.

    Intuitive & Correlative Navigation

    SEM MAP helps to locate regions of interest quickly, and delivers accurate correlated optical and SEM images using only one click. Optical and EM correlation function, SEM MAP is fully integrated into the graphical user interface.

    Movie Reference

    Eric Miller talks about FlexSEM 1000

    So compact that it fits on a tabletop, while enhancing the resolution

     

    Features

    COMPACT SLIM BODY

    A compact design (450 mm wide) minimizes system footprint. The FlexSEM is designed with separable units for flexible system placement. The entire system requires only a standard wall outlet for power.

    UNPARALLELED IMAGE QUALITY

    The newly developed electron optical column and Ultra-Variable-Pressure Detector (UVD) enable superior imaging of specimen surfaces at low-accelerating-voltages and low-vacuum conditions.

    Functional Resin Fracture
    Sample: Functional Resin Fracture
    Vacc: 5 kV; Mag: 5,000X
    Pressure: 50 Pa; Signal: UVD

    Pyrite Fracture Surface
    Sample: Pyrite Fracture Surface
    Vacc: 5 kV; Mag: 1,000X
    Pressure: 40 Pa; Signal: UVD

    INTUITIVE OPERATION

    The user-friendly GUI as well as accurate and fast Auto Focus Control (AFC) and Auto Brightness and Contrast Control (ABCC) algorithms, take only 5 seconds to enable optimized imaging performance with minimal time and effort.

    NEW CAMERA NAVIGATION - "SEM MAP"

    The "SEM MAP" function makes traversing across an entire specimen effortless. Navigate your sample with the use of an optical camera, and deliver accurate correlated Optical and SEM images using only one click.

    Application Data

    Materials Science

    Tungsten disulfide

    Accelerating Voltage: 15 kV
    (a) Accelerating Voltage: 15 kV

    Accelerating Voltage: 3 kV
    (a) Accelerating Voltage: 3 kV

    Magnification: 10,000X
    Signal: SE, Without metal coating

    Point of View
    The FlexSEM employs an Opti-Bias system that provides higher emission current at low kV for optimum brightness. The result is best-in-class image sharpness (S/N) at a low accelerating voltages.

    Hydrogen absorbing alloy

    Accelerating Voltage: 15 kV
    Accelerating Voltage: 5 kV
    Magnification: 30,000X
    Signal: SE, Without metal coating

    Cement

    Accelerating Voltage: 3 kV
    Accelerating Voltage: 3 kV
    Magnification: 15,000X
    Signal: SE, Without metal coating

    Biology

    Butterfly wing

    Accelerating Voltage: 15 kV
    Accelerating Voltage: 5 kV
    Magnification: 40,000X
    Signal: SE, With metal coating

    Pollen

    Accelerating Voltage: 3 kV
    Accelerating Voltage: 5 kV
    Magnification: 500X
    Signal: UVD, Without metal coating

    Semiconductors

    Wedge Bond

    Accelerating Voltage: 15 kV
    Accelerating Voltage: 5 kV
    Vacuum: 30 Pa
    Magnification: 1,000X
    Signal: BSE, Without metal coating

    Accelerating Voltage: 3 kV
    Accelerating Voltage: 5 kV
    Vacuum: 30 Pa
    Magnification: 5,000X
    Signal: BSE, Without metal coating

    Applications

    Hitachi SEM Application Data

    Technical magazine
    "SI NEWS"

    This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.

    nanoart

    Photo collections of beauty of metals, minerals, organisms etc. reproduced by the electron microscope and finished more beautifully by computer graphic technology.

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