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Hitachi

Hitachi High-Technologies in Korea

Focused Ion Beam Systems (FIB/FIB-SEM)

High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation

SCIENTIFIC INSTRUMENT NEWS

Tabletop Microscope (Benchtop SEM)| TM4000/TM3030Plus/TM3030 Dedicated Website

FE Electron Microscope IEEE Milestone Special Website