This website uses JavaScript. If you do not have JavaScript enabled in your browser, this website may not function or appear properly. Please enable JavaScript in your browser settings when using this website.

Hitachi High-Tech Top
한국어
Global Network
Sitemap
Contact Us

Products & Services
About Us
Support

Semiconductor Manufacturing Equipment
Science & Medical Systems
Advanced Industrial Products

TOP
Products & Services
Science & Medical Systems
Focused Ion Beam Systems (FIB/FIB-SEM)

Electron Microscopes

Focused Ion Beam Systems (FIB/FIB-SEM)

High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation