Tabletop Microscopes TM4000PlusIII/TM4000III

Features

Reduce Your Workload and Achieve More consistent Results

Automated observation of multiple specimens: Recipe Control^*1

The TM4000PlusIII recipe function can be used to automatically execute operations, such as stage movement, magnification setting, and image capturing. Once the user builds a recipe, it can be executed to run the tool automatically with no further intervention. This significantly reduces the workload on operators and allows for more consistent results, even from inexperienced users.

Faster automatic particle analysis: High-current function + AZtecLiveLite particle analysis package^*

Tasks such as purity analysis of industrial products and particle analysis of filters can be time consuming as data is required from many locations to complete the analysis. The TM4000PlusIII is equipped with a new high-current setting, Mode 5, which provides increased signal for imaging and EDS analysis. In combination with the Oxford Instruments EDS AZtecLiveLite particle analysis package, this helps to increase throughput.

Field-of-view navigation with less noise: High-current function

SEM field-of-view navigation is performed using fast scanning modes, so images tend to be prone to noise. The high-current function allows for easy field-of-view navigation due to its high signal-to-noise (S/N) ratio. This takes the stress out of specimen navigation!

Plan Ahead with the Filament Monitoring Function

Maintenance planning: Filament monitoring function

The TM4000PlusIII is equipped with a system that monitors the filament and displays graphics to show the remaining lifetime of the filament. If the equipment is being operated by multiple users, this makes it possible to plan the use of the tool in a systematic way. There is no more need to worry about the filament suddenly running out when the tool is most needed.

Ideal for Educational Purposes

Experience the world of electron microscopy with no preprocessing required:
Low-vacuum function + high-sensitivity backscattered-electron detector

Users can try out electron microscopy with all kinds of specimens: picked flowers, treasured minerals, or familiar foods, with no need for metal coating. The low-vacuum function of the TM4000PlusIII/TM4000III reduces preprocessing, and the high-sensitivity backscattered-electron detector (BSED) allows images to be obtained quickly.

Build programming skills with workflow automation functions (TM4000PlusIII)^*1

Developing and maintaining digital skills is vital in today’s world. The automation support function allows you to experientially learn important programming concepts such as "sequential execution," "repetition," and "conditional branching" through the operation of the TM4000PlusIII.

*1 Optional for TM4000PlusIII only

*2 Optional

Obtain quality images with simple steps.

Automation, Observation, and Elemental Analysis

Easily obtain images from different detectors with a single click: SE, BSE, or Mixed Signal.

Rapid acquisition of elemental maps ^*2

Sample: Wrist watch

*1 Secondary electron images and MIX images can only be observed in TM4000Plus III

*2 Option

Intuitive operation on Camera Navi

Camera Navi provide optical correrlation to SEM stage positions for easy navigation to areas of interest.
SEM images can be overlayed on the SEM MAP image

Sample: Wrist watch

Report Creator^*

Easily select images and templates to create customized reports.
Reports can be saved/edited in Microsoft Office^® formats.

Sample: Wrist watch

* Option

Image non-conductive samples with ease

Charge-up reduction mode

Vacuum adjustments, to reduce sample charging, can be done with a single click.

Image a variety of materials under low-vacuum condition

Utilize a variety of low-vacuum conditions to image different materials.

Obtaining SE images in low-vacuum mode

Innovative secondary-election detector obtains surface detail with non-conductive samples at lower vacuum conditions

The TM4000PlusIII can observe not only conductive samples, but also non-conductive or hydrated samples without extensive sample preparation. Users can switch between BSE and SE signals easily.

High-sensitivity Low-vacuum SE Detector (UVD)

Hitachi's UVD generates secondary-electron images from visible light through electron-gas interactions.

20kV Accelerating Voltage Advantages

High-accelerating voltage enables higher-speed EDS analysis.

EDS mapping data at 20 kV in 2 min

Multi Zigzag^*

Multi Zigzag automatically capture multiple SEM images and stitch together into a single high-resolution image.

* Option

STEM Holder^*

STEM holder (Option)

Easily obtain transmitted images on thin samples

The newly developed STEM holder is used to perform transmission images in combiantion with the Hitachi UVD.

* Option

* UVD is an optional function for the TM4000III

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