3D Visualization Software Hitachi map 3D
![3D visualization software Hitachi map 3D](/th/en/media/map3d_main_tcm45-56728.png)
Three-dimensional models allow Z-height Measurements
Using Hitachi' s latest high speed, 4-segment Backscattered Electron Detector, a three-dimensional model can be generated without sample tilting or manually collecting consecutive images.
- Directly edits on the flexible layout display.
- Supports various measurements such as height, area, and volume as well as ISO-compliant□surface roughness.
- Automated and traceable analysis workflow including report creation.
Features
Hitachi map 3D Software Overview
Hitachi map 3D generates three-dimensional images without sample/stage tilting or image shift.
Hitachi map 3D captures all four directional images simultaneously with a high-speed, segmented Backscattered Electron Detector (BSED).
![Hitachi map 3D software overview](/th/en/media/map3d_01_tcm45-56900.png)
Flexible Profile Analysis
Automatically collects data from the sample surface or cross-sectional profile for surface roughness and structural height, or makes various measurements between the 2 points.
- Cross-sectional profile display from any points within the 3D map
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Measurement location can be selected freely from vertical, horizontal, and diagonal points from the 3D image.
Whenever the measurement location is changed, the measurement results respond in real time.
![-](/th/en/media/map3d_02_tcm45-56901.png)
- Height and angle measurements are possible on the user defined line profile.
![-](/th/en/media/map3d_03_tcm45-56902.png)
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X, Y, and Z analysis between 2 points on the surface or cross section.
Distance, Z-height, slope, or angle can be measured between 2 points on the 3D map image.
![-](/th/en/media/map3d_04_tcm45-56903.png)
High-definition 3D Image Display
- Numerous 3D rendering modes are user selectable for surface characterization. Animations can be applied to the 3D image and saved as a video file.
Sample:Screw
A Wealth of Report and Measurement Functions
- Surface and line profile roughness measurements can be made on any area of the 3D reconstructed image.
- Any sample results before and after the processing can be simultaneously displayed side by side on a report layout.
![-](/th/en/media/map3d_05_png_tcm45-71103.png)
Various Output Formats Supported
- Report data can be output to several formats including RTF (Word-compatible), PDF, and more.
- Three-dimensional reconstruction data can be output in txt, STL format (3D printer compatible), and more.
![-](/th/en/media/map3d_06_tcm45-56905.png)
Full-Featured Help Function in Multiple Languages
- The help function describes the formulas used for each measurement mode.
- Available in 11 languages.
Specifications
Item | Description |
---|---|
Import function | Automatic select and read function of four segment BSE image data |
Measurement performance | Measurement performance varies depending on calibration accuracy, the condition of the type of specimen, the observation mode, and the observation condition. Detectable angle range ±60° (reference) TM4000 ±50° (reference) |
Measurement Function | Section profile display extracted between any area on the three dimensional image |
Distance of X and Y, length and any angle measurements between two points, surface area, and volume | |
Distance of X, Y, and Z, length and many other measurement functions between 2 points specified on section profile | |
Simple profile and surface roughness measurements | |
Baseline (straight, curve), leveling, and multiple offsets | |
Cutting surface, Color contour line, Bird' s-eye view, and pseudo color display | |
Layout, templates, and image composition from multiple-image function | |
Three-dimensional display function | Rotation, zoom-in, and multiple rendering processes. Animation video record function of observation screen |
Output function | Report/image: PDF, RTF/PNG, JPG, GIF, TIF, BMP, EMF |
3D image/movie: SUR, 3MF, STL, WRL, TXT/X3D/WMV, AVI |
Application Data1
Basic Functions for Height Analysis
3D View
- The sample can be observed from any direction from the 3D map view of the surface.
![-](/th/en/media/map3d_07_tcm45-56906.png)
Contour Lines Display
- Contour lines display available.
![-](/th/en/media/map3d_08_tcm45-56907.png)
Color Editor
- Apply pseudo coloring to SEM images.
![-](/th/en/media/map3d_09_tcm45-56909.png)
Application Data2
Effective 3D Analysis Functions
3D Stitch
- Large areas can be automatically stitched from multiple contiguous 3D-reconstruction regions of interest.
![-](/th/en/media/map3d_10_tcm45-56910.png)
Contour Analysis
- Diameter, angle, etc. can be measured on the extracted area or line profile.
![-](/th/en/media/map3d_11_tcm45-56911.png)
3D Reconstruction by Stereotypic Images
- Reconstruction of 3D images by using either BSE or SE images.
![-](/th/en/media/map3d_12_png_tcm45-71104.png)
Correlative Microscopy
- Correlate electron and optical images with Hitachi map 3D.
![-](/th/en/media/map3d_13_tcm45-56922.png)
3D Gallery
Hitachi map 3D Adds Depth to Your SEM Data
Hitachi map 3D allows you to augment your 2D SEM data with Z-height information
Electronics
Sample: Fractured surface of semiconductor
Signal: Backscattered electrons
Magnification: 1,000x
Sample: Defect surface on the connector
Signal: Backscattered electrons
Magnification: 1,200x
Materials
Sample: Solar cell
Signal: Backscattered electrons
Magnification: 2,000x
Sample: Micro-lens array
Signal: Backscattered electrons
Magnification: 2,000x
Biology
Sample: Boiled egg yolk
Signal: Backscattered electrons
Magnification: 200x
Sample: Compound multifaceted eyes of dragonfly
Signal: Backscattered electrons
Magnification: 1,000x
Sample: Hair
Signal: Backscattered electrons
Magnification: 1,000x