Vortex® Silicon Drift Detector
General Description
General Description - Vortex
Vortex silicon drift X-ray detectors feature active areas between 30 mm2 and 80 mm2. Vortex detectors are produced from high purity silicon using state-of-the-art CMOS production technology. They feature excellent energy resolution (<130 eV FWHM at Mn Kα is typical) and a high count rate capability. At a very short peaking time of 0.1 µs, an output count rate of 900 kcps is achieved. A unique feature of these detectors is their ability to process high count rates with very small loss in energy resolution and minimal peak shift with count rate.
Typical Applications
- X-ray fluorescence (XRF) spectroscopy both bulk and micro-fluorescence
- Micro XRF (additional sizes available in near future)
- X-ray diffraction (XRD)
- Partical Induced X-ray Emission (PIXE)
- Total Reflection X-ray Fluorescence (TXRF)
- Synchrotron radiation applications
- Process control
The Vortex is operated at near room temperature and cooled by a thermoelectric cooler (TEC) and can be cycled as frequently as needed without any degradation in detector performance. Cool down times are typically less than 2 minutes.
The Vortex X-ray spectroscopy systems include a detector unit and control box which includes power supplies for the detector, TEC and an optional digital pulse processor with our PI-SPEC Software.
The complete detector also contains a charge-sensitive preamplifier and temperature stabilization system, which eliminates concerns of varying ambient temperature.
Features
- Available in 30, 40, 50, 65, 70, 80 mm2
- Available in thickness of 0.5, 1, and 2 mm
- Superb energy resolution
- Detector temperature stabilization
- Advanced vacuum system ensures limitless temperature cycles
- Additional sizes are available under special contracts
- Digital pulse processor (DPP) with PI-SPEC Software
- RoHS Compliant
- US Patent Numbers: 6,455,858 and 7,129,501 B2
Specifications
| Detector | Material – Silicon Active Area – 30-80 mm2 – Thickness – 0.5, 1, and 2 mm |
|---|---|
| Window | Material – Beryllium Thickness – 12.5 and 25 µm (alternatives available) |
| Energy Resolution (FWHM) @ 5.9 keV | @ 1.0 µs Peaking Time 124 eV - 138 eV @ 0.5 µs Peaking Time 130 eV - 139 eV @ 0.25 µs Peaking Time 135 eV - 148 eV @ 0.1 µs Peaking Time 145 eV - 180 eV |
| Preamplifier | Type – Charge sensitive, 1.5 mV/keV Signal polarity – Positive Reset – Electrical, <1 µs duration Rise time – <100 ns |
| Cooling | Thermoelectric |
| Power Consumption | Nominal voltage – 110/230 V (switchable) Power supply and detector – 40 W Maximum |
| Physical Specifications | Detector package weight – 680 g Length – 181 mm (33 mm probe) Height×Width – 62 mm×62 mm Cable Standard Length – 3 m |
| Digital Pulse Processor (DPP) | |
| Digital Controls | Gain – 16-Bit DAC Peaking Time – 0.25-16 µs Preset Time – Up to 1717s |
| Data Output | Spectrum Size – 1024, 2048 or 4096 channels Channel Size – 10, 20 or 40 eV |
| Integral Non-linearity | 0.1% of full-scale output |
| Deadtime Correction | Better than ± 0.5% accuracy from 0 to 120,000 cps at 4 µs peaking time |
| Software | PI-SPEC software* – Allows user to acquire, manipulate spectra. Pentium III or later with at least 64 MB memory and 30 MB available disk space. VTXDLL package* – Dynamic-Link Library to facilitate host software communication with the DPP. Pentium III or later with at least 64 MB memory and 30 MB available disk space. |
* Requires a standard USB2.0 port
