AC Series Photoemission Yield Spectroscopy in the Air (PYSA)
AC Series has an open air system that can determine the Work Function (WF) and the Ionization Potential (IPs) for a variety of material types such as organic material, semiconductor, and metal. Material format can be from thin film to powders.
Overview
Allows Easy Measurement of the Work Function (WF) and the Ionization Potential (IPs)
The AC Series is a device that measures the electronic structure of the material (work function, ionization potential) by the photoelectric effect. In the atmosphere, detecting the minute photoelectrons by weak ultraviolet radiation with little disturbance factors such as the voltage application, it is possible to analyze the sample surface in a non-destructive and non-contact.
Features
- Atmospheric-pressure operation
- High-precision measurement for counting photoelectrons one by one
- Noncontact and damage-less measurement
- Ease of operation, measurable in a short time (about 5 min)
- Measures thickness of thin film and lubricating film
- Measures density of states in the vicinity of band gap
- Measurement of thin film, powder, and liquid
- Abundant publication record
Application
- OELD, OTFT, Organic film solar cell
- Photocatalyst
- Carbon nano tube, Fullerene
- Carbon thin film, Diamond thin film
- Cosmetics, Nostrum, Pharmaceutical products
- OPC
- Electrode, Lead frame, Silicon wafer, Compound semiconductor wafer
- Metals for Electrode
Specifications
| Model | AC-5 | AC-2 | AC-3 |
|---|---|---|---|
| Measurement principle | Photoemission Yield Spectroscopy in Air (Low-energy electron counting) | ||
| Electron detector | Open counter | ||
| Photoelectron measurement energy scanning range | 3.4 eV to 6.2 eV (364 nm to 200 nm) | 4.0 eV to 7.0 eV (310 nm to 177 nm) |
|
| Light intensity measurement energy scanning range | 3.4 eV to 6.2 eV (364 nm to 200 nm) | 4.0 eV to 7.0 eV (310 nm to 177 nm) |
|
| Repeatability (standard deviation) | Work function 0.02 eV (sample: metal plate) | ||
| Measurement time | Standard time required for work function measurement: Approx. 5 minutes | ||
| Sample shape | 180 mm × 180 mm (max.) Max. thickness 1.0 mm ±0.2 mm |
50 mm × 50 mm (max.) Max. thickness 10 mm (max.), 1-point measurement |
30 mm × 30 mm (max.) Max. thickness 10 mm (max.), 1-point measurement |
| Measurement location | Multiple locations can be specified on the sample stage for sequential measurement. | Measures sample center | |
