Microscopy Solutions for Materials Science
Throughout history, materials and materials science have played a critical role in the development of the world around us. Aspects of this field impact each one of us daily in the form of everything from simple household items to handheld digital devices and more. In the development of such items, the electron microscopes have been at the core of many important contributions to the field of materials science, whereby, they provided the ability to elucidate characteristics of morphology, composition, physical properties, and even dynamic behavior of incorporated materials. Such instruments are also indispensable for product quality control and understanding the development of new materials. Hitachi High-Tech offers a diverse product line-up to address these points and more, including tabletop SEM systems for quick user-friendly operation, FE-SEM as well as TEM systems for performing high-resolution analyses, and FIB-SEM systems capable of three-dimensional volumetric analysis.
Imaging & Analysis
Tabletop Microscopes TM4000II / TM4000Plus II
Newly released TM4000 II series provide 20kV accelerating voltage and also allow wide area of SEM observation by adding Multi Zigzag function (Option) Tabletop Micro scope offers further enhanced observation and analysis application world.
Scanning Electron Microscope FlexSEM 1000 II
FlexSEM 1000 II employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional Ultra Variable pressure Detector (UVD) enhance surface imaging capability of samples under low vacuum environment.
Scanning Electron Microscopes SU3800/SU3900
Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.
Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000
The SU7000 is designed to allow simultaneous acquisition of multiple secondary and backscattered electron signals, and enables rapid capture of many types of signals. With the ability to display and store up to 6 signal channels simultaneously, the SU7000 offers unsurpassed imaging performance. In addition, it provides a flexible of specimen chamber and vacuum system to support the broad range of observational conditions. Moreover, the electron gun—with its built-in Schottky emitter—can provide irradiating beam currents of up to 200 nA. The SU7000 is built to accommodate the full diversification of future analytical methods.
Schottky Field Emission Scanning Electron Microscope SU5000
SU5000 combines Schottky emission electron source and out-lens objective lens for high resolution imaging and diverse analyses of samples with various sizes and compositions. Its drawer type stage allows applications with special stages such as heating, tensile, and so on. Unique user interface, EM Wizard supports best SEM experience of every user.
Focused Ion and Electron Beam System Ethos NX5000 Series
The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for nanoscale precision processing.
Ultra-high Resolution Scanning Electron Microscope SU9000
SU9000 is the top-of-the-line SEM equipped with cold FE electron source and in-lens objective lens with least aberration, and achieves the world's highest SE resolution of 0.4nm. In addition to high resolution STEM with 0.34nm resolution, EELS and diffraction that are usually considered difficult for SEM can also be supported.
Ion Milling System IM4000Plus
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.
Sample Cleaner ZONESEMII
The ZONESEMII Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.
MC1000 Ion Sputter Coater
An ion sputter increases the conductivity of non-conductive sample to prevent charging during electron microscope observation. MC1000 employs magnetron sputtering technology to reduce damage to the sample, and the target can be selected from among Pt, Pt-Pd, Au and Au-Pd depending on the purpose.