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Single wafer type ion beam etching machine
Product information of Single wafer type ion beam etching machine.
Batch type ion beam etching machine
Product information of Batch type ion beam etching machine.
Spin Processor (MSP-1)
This spin processor is suitable for R&D and small production. All processes from chemical process to dryer are in one cup.
Multi Spin Processor (MSP-2)
Multi spin processor is suitable for mass production and Multi complex process.
Batch Type Wet Station
Our system has batch type cleaning ,resist stripping and etching potions. All processes from chemical cleaning to dryer are fully automated.
Focused Ion Beam Systems (FIB/FIB-SEM)
Introduction of Focused Ion Beam Systems (FIB/FIB-SEM)
Rail and Conductor Inspection Systems
A Full Lineup of Inspection Equipment That Supports Japan's World-Class Railroad Network. Our test equipment is used in the test cars of Japan's major railroad companies, including the test car for the Shinkansen bullet train. From car-mounted systems, to towed and manually-operated devices, our rail and contact wire inspection systems operate around the clock under regular operating speeds to ensure safety, reliability and a smooth ride.
Disk Surface Inspection System NS7000 Series
A high-precision surface inspection system for substrate and disk featuring a sophisticated defect classification function by laser irradiation of multi dearing and newly developed incline defect method.
Head Element Configuration Inspection Systems BM3100 Series
The BM3100 Series Head Tester is a powerful equipment that measures the width of the magnetic field of a magnetic recording head. Using a magnetic force microscope (MFM), it can measure the magnetic field width with high-resolution and performs the measurement in a non-destructive (non-contact) method under high-speed conveyance positioning and high speed. The high-speed, fully-automated equipment can support mass production.