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  5. Lithium-Ion Rechargeable Battery Solution:Electron microscopes for quality control

Scanning electron microscope

SU3800/SU3900

Imaging and analysis for wide range of FOV.
Widely used for quality control of materials and products.

The scanning electron microscopes SU3800 and SU3900 have been widely used in production sites of lithium-ion batteries for tasks such as inspection and particulate contamination analysis. They deliver versatile analysis such as particles' fine structure observation, 3D morphology evaluation and composition analysis by EDS. Such analysis work flow is possible to be automated and may give great contribution to improve productivity of lithium-ion batteries.

SU3800/SU3900

Enhanced operability and expandability, supports large specimen.

SU3800 and SU3900 are equipped with multipurpose large specimen chamber. They support versatile analysis by means of various analytical accessories. They also support large specimen up to 200 mm (SU3800) and 300 mm (SU3900) of diameter. Multi stub specimen holder is also available.

Multi stub specimen holder, SEM image, Automatic particle identification

Scanning electron microscope

FlexSEM1000Ⅱ

FlexSEM1000Ⅱ

High performance yet compact.

FlexSEM1000II is an ideal scanning electron microscope for production management of lithium-ion batteries. It features a small footprint, high-performance (resolution: 4 nm), and easy-to-observe operational environment. The easy-to-use oriented user interface enables stable data acquisition.

Continuous image capture function, Application

Tabletop microscope®

TM4000PlusⅡ

TM4000PlusⅡ

Image observation in 3 minutes.

Hitachi High-Tech established a new genre of electron microscopes called tabletop microscopes. TM4000Plus II is the latest model in the series. No sample preparation is required, and the time from pumping down to image acquisition is just 3 minutes. The whole process from observation, elemental analysis and report creation can be performed quickly. Ideal for quality control of lithium-ion batteries at each process stage.

Wide area mapping, EDS particle analysis