Skip to main content

Hitachi

HIGHTECH EXPOHitachi High-Tech GLOBAL

Now Loading...

Sectoral Solutions of Hitachi High-Tech

Semiconductor

Seminar Movie

Product Case Studies

SI NEWS

Designing the next generation of electron microscopes Future technologies and that possibilities, as envisioned by the young researchers of today

Designing the next generation of electron microscopes Future technologies and that possibilities, as envisioned by the young researchers of today

INTERVIEW

Observation of Solution Samples by Transmission Electron Microscope

Observation of Solution Samples by Transmission Electron Microscope

Yuki Kimura
PhD (science)
Associate Professor
Institute of Low-Temperature Science
Hokkaido University

Trend in Operando Nanoscale Characterization using Scanning Probe Microscopy

Trend in Operando Nanoscale Characterization using Scanning Probe Microscopy

Daisuke Fujita
Executive Vice President
National Institute for Materials Science

Fabrication of nickel barcode nanowire and characterization by SU9000 scanning electron microscope

Fabrication of nickel barcode nanowire and characterization by SU9000 scanning electron microscope

Tsuyohiko Fujigaya
Ph.D. in Engineering
Associate Professor
Faculty of Engineering
Kyushu University

Observation of graphene on SiC using various types of microscopy

Observation of graphene on SiC using various types of microscopy

Masao Nagase
Ph.D. in Engineering
Professor, Institute of Technology and Science
Tokushima University

Various Information from SEM with High Throughput, Schottky FE-SEM SU7000

Various Information from SEM with High Throughput, Schottky FE-SEM SU7000

Shigeaki Tachibana

HF5000 Field-emission Transmission Electron Microscope: High Spatial Resolution and Analytical Capabilities for Material Science

HF5000 Field-emission Transmission Electron Microscope: High Spatial Resolution and Analytical Capabilities for Material Science

Hiromi Inada

Ethos NX5000 High-Performance FIB-SEM

"Ethos NX5000" High-Performance FIB-SEM

Hidekazu Suzuki

Hitachi's State-of-the-Art Ion Milling Systems

Hitachi's State-of-the-Art Ion Milling Systems

Hiroyuki Ito
Yuki Inagi

ZONE II for SEM: Tabletop Specimen Cleaner

ZONE II for SEM: Tabletop Specimen Cleaner

Masako Nishimura
Rie Nakajima
Shinichi Hasegawa
Takeshi Sunaoshi

Three-dimensional morphology measurements of ultrasmall regions with the AFM5500M probe microscope

Three-dimensional morphology measurements of ultrasmall regions with the AFM5500M probe microscope

Shigeru Wakiyama

Triple Beam FIB-SEM-Ar(Xe) Combined System NX2000

Triple Beam FIB-SEM-Ar(Xe) Combined System NX2000

Masahiro Kiyohara
Takahiro Sato
Shota Torikawa

Focused Ion Beam system MI4050

Focused Ion Beam system MI4050

Yasushi Kuroda
Yoshihisa Oishi
Ikuko Nakatani
Shota Torikawa

Introduction to Model UH4150AD UV-Vis-NIR Spectrophotometer

Introduction to Model UH4150AD UV-Vis-NIR Spectrophotometer

Yuka Iwaya
Takayuki Wakui

Observation of the nanoscale structure, composition, and material properties of a hot-deformed Dy-free Nd2Fe14B magnet using ion milling, SEM, and SPM at the same area

Observation of the nanoscale structure, composition, and material properties of a hot-deformed Dy-free Nd2Fe14B magnet using ion milling, SEM, and SPM at the same area

Takehiro Yamaoka
(Analytical Application Engineering Section Tokyo, Hitachi High-Tech Science Corporation)

High-sensitivity EDX analysis using QUANTAX FlatQUAD (EDX) with SU8200 Series Instruments

High-sensitivity EDX analysis using QUANTAX FlatQUAD (EDX) with SU8200 Series Instruments

Toshiya Watanabe
(Hitachi High-Tech, Applications Development Dept., Tokyo Solutions Group)

Application Panel

Application Introduction

Product
Title / Discription