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The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex® silicon drift detector. The improved X-ray detection efficiency enables high-throughput and high-precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
Improved Sensitivity(Spectrum image of Au)
The FT150, having a irradiation spot size of 30µm (FWHM:17µm), achieved a fluorescent X-ray intensity twice that of the conventional instrument, FT9500X. For typical application, measurement time to obtain same precision is reduced by half.
Select the instrument suitable for your samples.
The newly designed door with a wide opening let you set the sample very easily. The closed housing minimizes the risk of X-ray leakage.
A large observation window and optimized parts arrangement improved visibility of the measurement position while the chamber door is closed.
The higher-resolution sample observation camera with a fully digital zoom provides the clear image of the sample having several tens of micrometers in diameter at a desired observation position. Lighting unit for sample observation uses LED which has an extremely long lifetime.
|Elements||Atomic No. 13(Al) to 92(U)|
|X-ray source||Tube voltage: 45kV|
|Mo target||W target||Mo target|
|Detector||SDD detector (No LN2 required)|
|X-ray focusing optics system||Polycapillary|
|Sample observation||CCD camera(1 million pixels)|
|Focus adjustment||Laser focus, auto focus|
|Maximum sample size||400(W)×300(D)×100(H) mm||400(W)×300(D)×100(H) mm||600(W)×600(D)×20(H) mm|
|Controller||Personal computer with 22 inch LCD Monitor|
|Measurement software||Thin film FP (Max 5 layers, 10 elements), Thin film Calibration curve method, Qualitative analysis|
|Data process||Microsoft Excel, Microsoft Word|
|Safety functions||Interlocked chamber door|
|Power consumption||Less than 300VA|