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Hitachi High-Technologies GLOBAL


Cross sectional observation of the earth

© Toshie Yaguchi, Yasushi Kuroda, Takeo Kamino (Hitachi Science Systems, Ltd.)
© Takahito Hashimoto (Instrument Division, Hitachi, Ltd.)
© Masato Nakatsuka (Head office, Tohoku University), Kazuyuki Tohji(Tohoku University)

The front picture shows SEM image of a stratified particle of Fe with TiO2 and SiO2 layers. The picture behind the SEM image shows STEM image of the particle after preparing transparent specimen by FIB technique. The cross sectional view demonstrate fine structures for the Fe particle and the layers of SiO2(20 nm), TiO2(40nm),SiO2(40 nm) and TiO2(20 nm).

At 56th photo contest hosted by the Japanese Society of Electron Microscopy in 2000.


  • Specimen: Multistratified particle
  • Instrument: Ultra thin film evaluation system HD-2000
  • Accelerating voltage: 200kV
  • Specimen: Courtesy of Professor Masato Nakatsuka (Head Office, Tohoku University), Kazuyuki Tohji(Tohoku University)
Part of information related to these photographers is based on the information when the photo was taken.
This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
Reproduction or republication without permission prohibited.
"nanoart" is registered trademark of Hitachi High-Technologies Corporation in Japan.