Skip to main content

Hitachi

Hitachi High-Technologies GLOBAL

The sample is scanned in the direction in which the cantilever is twisted. Frictional force, occurring between probe and sample, is converted into cantilever’s torsion which is simultaneously detected as frictional and topographic images.


Animation of FFM Observation: Silicon oil film on polystyrene


Friction distribution measurement of silicon oil film on polystyrene

Friction of oil film is less, resulting in dark contrast in FFM and LM-FFM images.
Scan area: 2.5 μm

  • Electron Microscopes (SEM/TEM/STEM)
  • Atomic Force Microscopes (AFM)
    • Description
      • Dynamic Force Microscope (DFM)
      • Scanning Tunneling Microscope (STM)
      • Sampling Intelligent Scan (SIS)
      • Phase Mode (PM)
      • Friction Force Microscope (FFM)
      • Lateral Modulation FFM (LM‐FFM)
      • ViscoElastic AFM (VE‐AFM) / Force Modulation Microscope
      • Adhesion
      • Current / Pico‐current
      • Scanning Spread Resistance Microscope(SSRM)
      • Kelvin probe Force Microscope (KFM)
      • Electrostatic Force Microscope (EFM)
      • Piezo‐Response Microscope (PRM)
      • Magnetic Force Microscope (MFM)
      • Scanning Non‐linear Dielectric Microscope(SNDM)
      • Atomic Force Microscope (AFM) / Contac Mode
    • Special Contents
    • Image Gallery

Products & Services