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Scanning Electron Microscope SU3500

Scanning Electron Microscope SU3500

Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging surface at low pressures. The SU3500 is sure to be the workhorse in any laboratory.

    Overview

    The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.

    Unparalleled Image Quality

    All new electron optics design with best-in-class image sharpness. 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.

    Intuitive Operation

    Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology.

    Ultra Variable-Pressure Detector

    Image surface information at low vacuum and low accelerating voltages.

    Stereoscopic Image Function

    Point and click for seamless, real-time "3D" image observation.

    5-axis Motor Drive Stage

    4-axis Motor Drive Stage

    The electron optics design yields unmatched imaging performance, achieving high resolution at low accelerating voltages.

    Gold particles on Carbon SE
    Accelerating Voltage : 3 kV
    Secondary Electron (SE) Image
    Magnification : 40,000x
    Resolution : 7 nm

    Gold particles on Carbon BSE
    Accelerating Voltage : 5 kV
    Backscattered Electron (BSE) Image
    Magnification : 30,000x
    Resolution : 10 nm

     

    Unique live signals can be mixed and displayed as a combined live image.

    Features

    Fast Auto Imaging

    "Best-in-class" Auto Start Functions (Focus, Brightness, Contrast, and Stigmation) for unmatched operational ease and efficiency.

    Low kV and Low Vacuum Performance

    The Hitachi "Hex-Bias" probe current optimization technology combined with the all new Ultra Variable-Pressure (UVD) detector offers superior imaging and surface information at low accelerating voltages and low vacuum conditions.


    Sample : Vinca (Periwinkle)
    Vacuum : 3.0 kV
    Magnification : 190x
    Pressure : 60 Pa
    Signal : Ultra Variable-Pressure Detector (UVD)


    Sample : Thread sealing tape (extended)
    Accelerating Voltage : 3 kV
    Vacuum : 30 Pa
    Magnification : 10,000x
    Signal : Ultra Variable-Pressure Detector (UVD), Without metal coating

    Live Stereoscopic Imaging

    Our advanced tilted-beam-scan technology enables point and click, real-time "3D" image observation (show 3D pictures from flyer).


    Sample : Crustacea
    Vacc : 15 kV
    Magnification : 100x
    Signal : Backscattered Electron (BSE)


    Sample : Brass Fracture
    Vacc : 15 kV
    Magnification : 5,000x
    Signal : Secondary Electron (SE)


    Sample : Textile
    Accelerating Voltage : 5 kV
    Vacuum : 50 Pa
    Magnification : 100x
    Signal : Ultra Variable-Pressure Detector (UVD)


    Sample : Rat intestine (Replica)
    Accelerating Voltage : 5 kV
    Magnification : 350x
    Signal : Secondary Electron (SE)
    Sample courtesy : Ms. Noriko Nemoto, Bio-imaging Center, Kitasato University

     

    Application Data

    Semiconductors

    PCB Cross-section


    Accelerating Voltage : 5 kV
    Vacuum : 30 Pa
    Magnification : 150x
    Signal : BSE, With metal coating


    Accelerating Voltage : 3 kV
    Vacuum : 20 Pa
    Magnification : 5,000x
    Signal : BSE, With metal coating

    Point of View
    Composition contrast is observable throughout the assembly above left and grain contrast of Cu on right image

    Materials Science

    ZnO


    Accelerating Voltage : 5 kV
    Magnification : 30,000x
    Signal : SE, Without metal coating

    Titanium Oxide Particle


    Accelerating Voltage : 3 kV
    Magnification : 15,000x
    Signal : SE, Without metal coating
    Sample : Courtesy of Prof. Masato Kakihana, Tohoku University

    Point of View
    A 50 nm diameter particle (arrowed) on the surface can be clearly observed at a low accelerating voltage of 5 kV.

    Point of View
    A 50 nm needle-like structure can be clearly observed at a low accelerating voltage of 3 kV.

    Tablet (Confectionery)


    Accelerating Voltage : 1.5 kV
    Magnification : 10,000x
    Signal : SE, Without metal coating

    Filler (Glass fibers) in Resin


    Accelerating Voltage : 1 kV
    Vacuum : 50 Pa
    Magnification : 1,000x
    Signal :BSE, Without metal coating

    Point of View
    A low beam dose for less sample damage at an accelerating voltage of 1.5 kV.

    Point of View
    Glass fiber that is susceptible to negative charging is clearly observed at a very low accelerating voltage of 1.0 kV.

    Gold-Isocyanide Complex


    Accelerating Voltage : 0.8 kV
    Magnification : 2,100x
    Signal : SE, Without metal coating

    Thread sealing tape


    Accelerating Voltage : 3 kV
    Vacuum : 30 Pa
    Magnification : 10,000x
    Signal : UVD, Without metal coating

    Point of View
    The microstructure of the ultra-thin surface is clearly observed at a very low accelerating voltage of 0.8 kV.

    Point of View
    Stretched and bent fibers are clearly observed under low-vacuum conditions.

    Life Sciences

    Helicobacter bills


    Accelerating Voltage : 2 kV,
    Magnification : 17,000x
    Signal : SE, With OsO4 coating
    Sample courtesy : Prof. Yoshiaki Kawamura, Aichigakuin University

    Bacteria


    Accelerating Voltage : 1 kV
    Vacuum : High
    Magnification : 10,000x
    Signal : SE (Ionic liquid treated)

    Point of View
    The twisted structure and flagellum are clearly observed at a very low accelerating voltage of 2 kV.

    Point of View
    Lactic bacteria is cultivated on agar media that is observed easily with the use of ionic liquid.

     

    Applications

    Hitachi SEM Application Data

    Technical magazine
    "SI NEWS"

    This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.

    nanoart

    Photo collections of beauty of metals, minerals, organisms etc. reproduced by the electron microscope and finished more beautifully by computer graphic technology.

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