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Advanced EDS features for tabletop SEM
Element series are EDX systems produced by EDAX Instruments. Si3N4 window SDD enhances the mapping speed and detection limits.
Sample configuration in combination with a TM4000 series instrument
Si3N4 Window to optimize low energy X-ray transmission for light element analysis. Conventional detector window, there is improved mapping speed and detection limit.
High X-ray transmittance
Extreme low energy detection
Hexagonal support grid for increased transmission