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Hitachi

Analytical Systems, Electron Microscopes & Medical Systems

TM Series Energy Dispersive X-ray Spectrometer: Element series

TM Series Energy Dispersive X-ray Spectrometer: Element series

Advanced EDS features for tabletop SEM

Element series are EDX systems produced by EDAX Instruments. Si3N4 window SDD enhances the mapping speed and detection limits.

Sample configuration in combination with a TM4000 series instrument

    Features

    Si3N4 Window

    Si3N4 Window to optimize low energy X-ray transmission for light element analysis. Conventional detector window, there is improved mapping speed and detection limit.

    Graph: High X-ray transmittance
    High X-ray transmittance

     

    figure: Extreme low energy detection
    Extreme low energy detection

    figure: Hexagonal support grid for increased transmission
    Hexagonal support grid for increased transmission

    APEX Software

    • Easy to Interpret Data
    • Multi user logins
    • User configurable windows
    • Customizable reporting
    • Simplified automation
    • Fast mapping
    • Collect/Review simultaneously
    • Spectrum Match Libraries

    Technical magazine
    "SI NEWS"

    This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.

    nanoart

    Photo collections of beauty of metals, minerals, organisms etc. reproduced by the electron microscope and finished more beautifully by computer graphic technology.

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