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Sample configuration in combination with a TM3030 series instrument
*Screen shows simulated image
Simple operation menu
Example of mapping analysis
In addition to standard spectrum acquisition, the system allows spectra for user-specified regions to be reconstructed from mapping data. The selected region may be a point, a rectangle, an ellipse, or a region bounded by a user-drawn freehand curve.
Spectrum-fitting functionality facilitates qualitative analysis. This feature is particularly useful for cases in which peaks overlap.
TruMap functionality allows high-precision, high-reliability visualization of X-ray distributions (AZtecOne)
The TruMap feature allows spectra with overlapping peaks to be separated and visually mapped in real time. In the example shown here, we obtain elemental mapping images of Mg-K and As-L—whose peaks lie atop one another in typical maps — with no image contamination due to overlapping peaks.
|Detector type||Silicon Drift Detector (SDD)|
|Detection area||30 mm2||10 mm2|
|Energy resolution||158 eV(Cu-Kα)
(equivalent to 137 eV with MnKα)
(equivalent to 129 eV with MnKα)
|Qualitative analysis||Auto ID and manual ID|
|Quantitative analysis||Standardless quantitative analysis|
|Point & ID(Beam control)||○|
|Standard Map / Line scan||○|
|TruMap / TruLine||○||－|