Schottky Field Emission Scanning Electron Microscope SU5000
Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination.
The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new level of SEM operation and control. Expert or novice, the result is now the same: Highest quality nano-scale images at everyone's fingertips!
Watch this 6-min video and see how the SU5000 and
EM Wizard work together!
- A novel, revolutionary user interface, EM Wizard, provides all users with optimum levels of resolution, repeatability, and throughput. With EM Wizard, beginners become experts overnight.
- Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand.
- A robust "draw-out" specimen chamber accommodates large specimens (-200 mmφ, -80 mmH).
- Rapid sample exchange with evacuation to observation in 3 minutes or less.
- Automated, intuitive on-demand image optimization on the fly.
- A visual and interactive guide offers 'pick and choose' SEM modes to ensure best operating conditions.
- With the 3D MultiFinder tool, samples are easily tilted and rotated with the image remaining centered and in focus.
Frontal Cortex of Rat
Specimen courtesy of Professor Kubota, NIPS, Japan
Rat Dorsal Root Ganglion Neuron
Specimen courtesy of
Dr. Ushiki and Dr. Koga(*), Niigata University
*: Asahikawa Medical University
Multi-Walled Carbon Nanotube Outer Structure
Multiple angle information from a newly developed annular Backscatter Electron Detector (BSD) acquires both topographic and compositional information simultaneously.
Specimen courtesy of Daido Steel.
In-situ Imaging and the Use of a Heating Stage in the Specimen Chamber
Specimen: Gold thin film on quartz substrate
Specimen courtesy of Dr. Yoshino and Dr. Terano, Tokyo institute of technology
3D analysis ; Lithium Ion Battery Material
3D re-constructed image of active material (orange) and PvdF (blue) distribution.
Images of Atomic Step and Threading Dislocation of n-GaN on Si
Specimen courtesy of Professor Egawa,
Research Center for Nano-Device and System
Nagoya Institute of technology, Japan
Article information on Hitachi technical magazine "SI NEWS"
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments. Those authors are notable researchers and Hitachi application engineers. This is an Schottky Field Emission Scanning Electron Microscope SU5000
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.