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Hitachi

Hitachi High-Tech in America

At Hitachi High-Technologies our primary goal is to provide researchers with powerful, dependable and easy-to-use microscope solutions for the advancement of science & engineering.

Find out what products are suitable for your application

Products

SEM / VP-SEM

Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM) with excellent imaging and analytical performance

FE-SEM

Field-Emission Scanning Electron Microscopes (FE-SEM) optimized for high-performance imaging and analysis for better understanding at the nanoscale

TEM / STEM

TEM and STEM solutions for structural and chemical characterizations of nanomaterials, semiconductors, pathology, neurology and life science research

FIB-SEM

Dual-beam and triple-beam FIB-SEM solutions offering the very best lamella preparation and powerful volume microscopy (3D imaging and 3D analysis)

Tabletop SEM

Tabletop and compact SEMs to make electron microscopy quick and easy. High-resolution imaging and fast chemical microanalysis (EDS)

Sample Preparation

Sample preparation systems helping you optimize your microscopy, including cross-section ion-milling systems and SEM/TEM sample cleaners

AFM

Innovative scanning probe microscopy (SPM) solutions for application ranging from surface topography to nanoscale surface property measurements