At Hitachi High-Technologies our primary goal is to provide researchers with powerful, dependable and easy-to-use microscope solutions for the advancement of science & engineering.
Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM) with excellent imaging and analytical performance
Field-Emission Scanning Electron Microscopes (FE-SEM) optimized for high-performance imaging and analysis for better understanding at the nanoscale
TEM and STEM solutions for structural and chemical characterizations of nanomaterials, semiconductors, pathology, neurology and life science research
Dual-beam and triple-beam FIB-SEM solutions offering the very best lamella preparation and powerful volume microscopy (3D imaging and 3D analysis)
Tabletop and compact SEMs to make electron microscopy quick and easy. High-resolution imaging and fast chemical microanalysis (EDS)
Sample preparation systems helping you optimize your microscopy, including cross-section ion-milling systems and SEM/TEM sample cleaners
Innovative scanning probe microscopy (SPM) solutions for application ranging from surface topography to nanoscale surface property measurements
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