Technical information
Automated AFM measurements following a recipe
A range of AFM operations that can be performed with just the touch of a button
Method 1 for Utilizing Recipes: Continuous measurement via electric stages
By setting multiple samples on an electric stage, it is possible to measure each, one by one.
Method 2 for Utilizing Recipes: Continuous narrow-range operation over multiple locations of a broad image range
After AFM measurement of the broad range, open the recipe and click on any domain of the broad image range with a mouse to perform continuous narrow-range measurement of multiple locations.
Method 3 for Utilizing Recipes: More efficient measurement, even with small units
Even if measurement is conducted by exchanging fragmented samples such as small units, operation can be performed with the single push of a button by creating a recipe for each sample.
Actual measurement cases
Can be used to measure nano-particles and perform quality control that addresses issues such as substrate film roughness.
Other features
Can be used to measure nano-particles and perform quality control that addresses issues such as substrate film roughness.
- Possible to set Q curve measurement conditions within recipes
- In addition to routine measurement according to parameters set for each sample, the automatic adjustment function RealTuneII can also be incorporated into recipe parameters
- Output of all hardness analysis results measured with recipe is possible as a CSV file
- For more advanced analysis, we also propose using an automatic analysis method that employs offline software.
This section introduces applications (actual measurement cases) for scanning probe microscopes (SPM/AFM).
Information for product users
This section offers information aimed at customers who use our scanning probe microscopes.
For first-time users
Related topics
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