Unique Feature
SIS(Sampling Intelligent Scan) Mode
- Do you have problems getting AFM topography data from your samples?
- SIS completely changes the concept of what is possible when it comes to AFM topography measurements.
- SIS provides stable and precise control of the AFM probe to quickly and accurately measure the topography and material property of your sample.
1. Issues with Conventional AFM Techniques, and Why SIS Can Offer Solutions
1-1 Conventional Scanning Methods
(1) Deteriorated tracking performance on down slope area(Parachuting)
(2) Lateral force induced sample damage during contact mode imaging
(3) Artifacts caused by cross-talk between topography and material properties
2. SIS Application Examples? Improved Topography & Phase Imaging
(1) Polytetrafluoroethylene sheet by DFM and SIS-DFM mode
(2) Grease by phase and SIS-phase mode
(3) Large adsorptive and adhesive sample or soft sample by DFM and SIS-DFM mode
(4) Solid polymer electrolyte membrane by DFM and SIS-Phase mode
(5) Lamella crystal/PET sheet by phase and SIS-Phase mode
(6) Advantages of SIS mode
(7) Adhesive material by phase and SIS-phase mode
3. SIS Application ExamplesーImproved Electrical Property Analysis
(1) Current measurements of soft conductive material by conductive AFM and SIS-conductive AFM
(2) Si dopant calibration sample by SSRM and SIS-SSRM
(3) Current leak spot of oxidized aluminum thin film by conductive AFM and SIS-conductive AFM
(4) Piezoelectric response domain mapping of ferroelectric thin film by PRM and SIS-PRM
4. SIS Application Examples
(1) Highly crystallized PVDF (polyvinylidene fluoride) by SIS-PRM
(2) Conductive polymer (PEDOT-PSS) coated film by SIS-conductive AFM in vacuum
By courtesy of Mr.Hiroji Kunitoshi, Analysis
Engineering Department, Nitto Analytical
Techno-center Co., Ltd.
(3) Lithium-ion battery cathode material (Ni-Co-Mn)O2 by SIS-SSRM in vacuum
(4) Voltage applied to Lithium-ion battery cathode material by SIS-conductive AFM
By courtesy of Mr.Hiroji Kunitoshi, Analysis
Engineering Department, Nitto Analytical
Techno-center Co., Ltd.
RealTune® II
Auto Tuning Fuctions for Optimal Measurement Parameters
The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever’s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!
SÆMic.(SEM-AFM Corrlation)
What is a SÆMic.?
It’s our innovative solution for correlative AFM-SEM imaging, SÆMic., enables easy navigation for analysis of composition, topography, physical properties, and more, at the same sample location.
Self Sensing probe
Advantages
- Photo sensitive materials
- Superior ease to use(no need laser alignment and photo detector)
- Easy to handle for mounting
The AFM5100N offers both Optical Lever System and Self-detection System. System simplifies difficult AFM operations. Its self-sensing cantilever has a sensor on itself, therefore this detection method does not require laser alignment. These two detection systems can be easily swapped by plugging in/out their cables to the main AFM unit.
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