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Analytical Systems, Electron Microscopes & Medical Systems
Analytical Systems, Electron Microscopes & Medical Systems TOP

Analytical Systems

Electron Microscopes / Atomic Force Microscopes

Medical Systems

Bio Systems
Application Note

Various information

News & Events
Semiconductor Manufacturing Equipment
Semiconductor Manufacturing Equipment TOP

Etch, CD-SEM and Defect Inspection Systems
Industrial & IT Systems
Industrial & IT Systems TOP

ICT Solutions

Industrial Solutions
Flat Panel Display Equipment

Hard Disk Manufacturing Equipment
Advanced Industrial Products
Advanced Industrial Products TOP

Automotive Sensor & Control Devices

Industrial Materials
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Functional Chemicals and Other Products

Battery life cycle management solution

What’s New

Jun 28, 2022

Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity

Jun 09, 2022

[June 14-17, 2022: Korea] Korea Lab 2022

Jun 02, 2022

Hitachi High-Tech Launches Dark Field Wafer Defect Inspection System DI2800, Achieving High-Sensitivity 100% Inspection for Semiconductor Devices in the IoT and Automotive Fields

May 31, 2022

Opened the new demonstration and collaboration base "Advanced-Technology Innovation Center Naka"

Dec 13, 2021

Hitachi High-Tech Develops the Electron Beam Area Inspection System GS1000 to Meet Increased Demand for Inspection and Massive-Metrology in EUV Applications

and more

News Releases

Jun 28, 2022

Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity

Jun 02, 2022

Hitachi High-Tech Launches Dark Field Wafer Defect Inspection System DI2800, Achieving High-Sensitivity 100% Inspection for Semiconductor Devices in the IoT and Automotive Fields

May 31, 2022

Opened the new demonstration and collaboration base "Advanced-Technology Innovation Center Naka"

Dec 13, 2021

Hitachi High-Tech Develops the Electron Beam Area Inspection System GS1000 to Meet Increased Demand for Inspection and Massive-Metrology in EUV Applications

Dec 09, 2021

Two New FE-SEM Models Launched to Support Data-Driven R&D

and more

Products & Services

Jan 15, 2020

Launch of Fluorescent X-ray Coating Thickness Gauge FT160 series that enables measurement of micro-spot smaller than 100µm

Dec 20, 2017

2017 latest nanoart "The flower in rhyolite"

Dec 19, 2017

[SCIENTIFIC INSTRUMENT NEWS Special site] S.I.Report: Examination of the light microscopic slide of renal biopsy specimens by utilizing Low-vacuum scanning electron microscope

Dec 12, 2017

[SCIENTIFIC INSTRUMENT NEWS Special site] Technical Explanation: The FlexSEM 1000: A Scanning Electron Microscope Specializing in 3D Morphology Measurements

Dec 07, 2017

2017 latest nanoart "Three Dimensional Structure of the HeLa Cell"

and more

Events

Jun 09, 2022

[June 14-17, 2022: Korea] Korea Lab 2022

Nov 15, 2021

[Dec 15-17, 2021: Tokyo, Japan] SEMICON Japan 2021

Nov 15, 2021

[Dec 15-17, 2021: Tokyo, Japan] SEMICON Japan 2021

Mar 15, 2021

[Mar 19-21, 2021: Shenzhen, China] China International Battery Fair(CIBF)

Dec 07, 2020

[Dec 11-Jan 15, 2020-2021: Tokyo, Japan] SEMICON Japan 2020

and more

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