Skip to main content

Hitachi

SearchSearch

Select Country/Region Global

Hitachi Group
Products & Services

Hitachi Group
Corporate Information

Hitachi High-Tech GLOBAL

  • Global Network
  • Sitemap
  • Contact Us
  • Products & Services
  • About Us
  • Support
  • TOP
  • Products & Services

Products & Services

  • Analytical Systems, Electron Microscopes & Medical Systems

    • Analytical Systems, Electron Microscopes & Medical Systems TOP
    • Analytical Systems
    • Electron Microscopes / Atomic Force Microscopes
    • Medical Systems
    • Bio Systems
    • Application Note
    • Various information
    • News & Events
  • Semiconductor Manufacturing Equipment

    • Semiconductor Manufacturing Equipment TOP
    • Etch, CD-SEM and Defect Inspection Systems
  • Industrial & IT Systems

    • Industrial & IT Systems TOP
    • ICT Solutions
    • Industrial Solutions
    • Flat Panel Display Equipment
    • Hard Disk Manufacturing Equipment
  • Advanced Industrial Products

    • Advanced Industrial Products TOP
    • Automotive Sensor & Control Devices
    • Industrial Materials
    • Electronic Components
    • Functional Chemicals and Other Products
    • Battery life cycle management solution

News

  • What’s New
  • News Releases
  • Products & Services
  • Events

What’s New

Jun 28, 2022
  • Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity
Jun 09, 2022
  • [June 14-17, 2022: Korea] Korea Lab 2022
Jun 02, 2022
  • Hitachi High-Tech Launches Dark Field Wafer Defect Inspection System DI2800, Achieving High-Sensitivity 100% Inspection for Semiconductor Devices in the IoT and Automotive Fields
May 31, 2022
  • Opened the new demonstration and collaboration base "Advanced-Technology Innovation Center Naka"
Dec 13, 2021
  • Hitachi High-Tech Develops the Electron Beam Area Inspection System GS1000 to Meet Increased Demand for Inspection and Massive-Metrology in EUV Applications
  • and more

News Releases

Jun 28, 2022
  • Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity
Jun 02, 2022
  • Hitachi High-Tech Launches Dark Field Wafer Defect Inspection System DI2800, Achieving High-Sensitivity 100% Inspection for Semiconductor Devices in the IoT and Automotive Fields
May 31, 2022
  • Opened the new demonstration and collaboration base "Advanced-Technology Innovation Center Naka"
Dec 13, 2021
  • Hitachi High-Tech Develops the Electron Beam Area Inspection System GS1000 to Meet Increased Demand for Inspection and Massive-Metrology in EUV Applications
Dec 09, 2021
  • Two New FE-SEM Models Launched to Support Data-Driven R&D
  • and more

Products & Services

Jan 15, 2020
  • Launch of Fluorescent X-ray Coating Thickness Gauge FT160 series that enables measurement of micro-spot smaller than 100µm
Dec 20, 2017
  • 2017 latest nanoart "The flower in rhyolite"
Dec 19, 2017
  • [SCIENTIFIC INSTRUMENT NEWS Special site] S.I.Report: Examination of the light microscopic slide of renal biopsy specimens by utilizing Low-vacuum scanning electron microscope
Dec 12, 2017
  • [SCIENTIFIC INSTRUMENT NEWS Special site] Technical Explanation: The FlexSEM 1000: A Scanning Electron Microscope Specializing in 3D Morphology Measurements
Dec 07, 2017
  • 2017 latest nanoart "Three Dimensional Structure of the HeLa Cell"
  • and more

Events

Jun 09, 2022
  • [June 14-17, 2022: Korea] Korea Lab 2022
Nov 15, 2021
  • [Dec 15-17, 2021: Tokyo, Japan] SEMICON Japan 2021
Nov 15, 2021
  • [Dec 15-17, 2021: Tokyo, Japan] SEMICON Japan 2021
Mar 15, 2021
  • [Mar 19-21, 2021: Shenzhen, China] China International Battery Fair(CIBF)
Dec 07, 2020
  • [Dec 11-Jan 15, 2020-2021: Tokyo, Japan] SEMICON Japan 2020
  • and more
Featured Contents
More
  • page top
  • Terms of Use
  • Privacy Policy

© Hitachi High-Tech Corporation. 2001, 2022. All rights reserved.