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Analytical Systems, Electron Microscopes & Medical Systems
Analytical Systems, Electron Microscopes & Medical Systems TOP

Analytical Systems

Electron Microscopes / Atomic Force Microscopes

Medical Systems

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Various information

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Semiconductor Manufacturing Equipment
Semiconductor Manufacturing Equipment TOP

Etch, CD-SEM and Defect Inspection Systems
Industrial & IT Systems
Industrial & IT Systems TOP

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Industrial Solutions
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Advanced Industrial Products
Advanced Industrial Products TOP

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Battery life cycle management solution

What’s New

Mar 15, 2021

[Mar 19-21, 2021: Shenzhen, China] China International Battery Fair(CIBF)

Dec 07, 2020

[Dec 11-Jan 15, 2020-2021: Tokyo, Japan] SEMICON Japan 2020

Dec 07, 2020

[Dec 11-Jan 15, 2020-2021: Tokyo, Japan] SEMICON Japan 2020

Nov 27, 2020

Hitachi High-Tech Launches 3D SEM CT1000

Nov 26, 2020

Hitachi High-Tech Launches New High-Speed Defect Review SEM CR7300

and more

News Releases

Nov 27, 2020

Hitachi High-Tech Launches 3D SEM CT1000

Nov 26, 2020

Hitachi High-Tech Launches New High-Speed Defect Review SEM CR7300

Nov 20, 2020

Development of a Rapid Diagnostics of Battery Degradation to Instantly Evaluate the Performance Degradation and Remaining Lifespan of Lithium-Ion Batteries

Nov 12, 2020

Hitachi High-Tech Strengthens its Photonics Capabilities to Serve Global Technology Markets

Nov 10, 2020

Introducing “Chemicals Informatics”: Software to Streamline New Product Research in the Chemical Industry

and more

Products & Services

Jan 15, 2020

Launch of Fluorescent X-ray Coating Thickness Gauge FT160 series that enables measurement of micro-spot smaller than 100µm

Dec 20, 2017

2017 latest nanoart "The flower in rhyolite"

Dec 19, 2017

[SCIENTIFIC INSTRUMENT NEWS Special site] S.I.Report: Examination of the light microscopic slide of renal biopsy specimens by utilizing Low-vacuum scanning electron microscope

Dec 12, 2017

[SCIENTIFIC INSTRUMENT NEWS Special site] Technical Explanation: The FlexSEM 1000: A Scanning Electron Microscope Specializing in 3D Morphology Measurements

Dec 07, 2017

2017 latest nanoart "Three Dimensional Structure of the HeLa Cell"

and more

Events

Mar 15, 2021

[Mar 19-21, 2021: Shenzhen, China] China International Battery Fair(CIBF)

Dec 07, 2020

[Dec 11-Jan 15, 2020-2021: Tokyo, Japan] SEMICON Japan 2020

Dec 07, 2020

[Dec 11-Jan 15, 2020-2021: Tokyo, Japan] SEMICON Japan 2020

Nov 20, 2020

[Nov 21-25, 2020: Chengdu, China] The 2020 National Electron Microscopy Annual Conference

Feb 13, 2020

[March 05.2020: Stassfurt, Germany] Inspection of electronic components with an electron microscope

and more

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