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Hitachi Group
Products & Services

Hitachi Group
Corporate Information

TOP
Products & Services

Products & Services

Analytical Systems, Electron Microscopes & Medical Systems

Analytical Systems, Electron Microscopes & Medical Systems TOP

Semiconductor Manufacturing Equipment

Semiconductor Manufacturing Equipment TOP
- Etch, CD-SEM and Defect Inspection Systems

Industrial & IT Systems

Industrial & IT Systems TOP

Advanced Industrial Products

Advanced Industrial Products TOP

What’s New
News Releases
Products & Services
Events

What's New

Jan 24, 2020

[Feb 3-7, 2020: Hyderabad, India] 12th Asia Pacific Microscopy Conference (APMC 2020)

Jan 15, 2020

Launch of Fluorescent X-ray Coating Thickness Gauge FT160 series that enables measurement of micro-spot smaller than 100µm

Dec 11, 2019

Hitachi High-Tech Develops Advanced CD Measurement SEM CG7300

Nov 19, 2019

[Dec 4-6, 2019: Chiba, Japan] 29th FINETECH JAPAN - LCD/OLED/SENSOR TECHNOLOGY EXPO

Nov 15, 2019

[Dec 11-13, 2019: Tokyo, Japan] SEMICON Japan 2019

and more

News Releases

Dec 11, 2019

Hitachi High-Tech Develops Advanced CD Measurement SEM CG7300

Nov 07, 2019

Strengthening Our Portfolio of Transmission Electron Microscopes for the Pharmaceutical Industry Through Investment to Vironova AB

Jul 03, 2019

Hitachi High-Tech Group to Lead Japanese Distribution of SparkCognition’s Automated Machine Learning Modeling Product, Darwin™

Jul 02, 2019

Hitachi High-Technologies to Launch Advanced High Voltage CD-SEM "CV6300 Series"

May 09, 2019

Hitachi High-Tech Science Launches the “NEXTA STA Series” Thermal Analyzer

and more

Products & Services

Jan 15, 2020

Launch of Fluorescent X-ray Coating Thickness Gauge FT160 series that enables measurement of micro-spot smaller than 100µm

Dec 20, 2017

2017 latest nanoart "The flower in rhyolite"

Dec 19, 2017

[SCIENTIFIC INSTRUMENT NEWS Special site] S.I.Report: Examination of the light microscopic slide of renal biopsy specimens by utilizing Low-vacuum scanning electron microscope

Dec 12, 2017

[SCIENTIFIC INSTRUMENT NEWS Special site] Technical Explanation: The FlexSEM 1000: A Scanning Electron Microscope Specializing in 3D Morphology Measurements

Dec 07, 2017

2017 latest nanoart "Three Dimensional Structure of the HeLa Cell"

and more

Events

Jan 24, 2020

[Feb 3-7, 2020: Hyderabad, India] 12th Asia Pacific Microscopy Conference (APMC 2020)

Nov 19, 2019

[Dec 4-6, 2019: Chiba, Japan] 29th FINETECH JAPAN - LCD/OLED/SENSOR TECHNOLOGY EXPO

Nov 15, 2019

[Dec 11-13, 2019: Tokyo, Japan] SEMICON Japan 2019

Nov 06, 2019

[Nov 17-19, 2019: Tokyo, Japan] International Symposium on Porous Materials 2019

Oct 18, 2019

[Oct 23-26, 2019: Beijing, China] 2019 Beijing Conference and Exhibition on Instrumental Analysis (BCEIA 2019)

and more