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  5. Analytical Services with Scanning Electron Microscopy (SEM)

Analytical Services with Scanning Electron Microscopy (SEM)

Analytical Services with Scanning Electron Microscopy (SEM)

Hitachi High-Tech America has a state-of-the art microscopy lab in Hillsboro, Oregon. Using innovative Scanning Electron Microscopes (SEM), dedicated equipment and a staff of full-time, industry-experienced engineers work on samples for various applications including but not limited to:

  • Semiconductor device inspection
  • Failure analysis and quality control
  • Nanomaterials and coatings
  • Geology and mineralogy
  • Biomaterials and life sciences

Available Instruments

Scanning Electron Microscopy (SEM)

  • High-Resolution Imaging: Capture ultra-high-resolution images to visualize surface morphology, texture, and structure at the micron and sub-micron scale.
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Secondary electron image of ArF Resist
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Acquisition of surface information of catalyst
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Recycled Paper (Acceleration Voltage: 15 kV)
  • Elemental Analysis: Using Energy-Dispersive X-ray Spectroscopy (EDX), we can provide qualitative elemental analysis, helping you understand material composition.
  • Accelerated Failure Analysis: SEM is ideal for investigating microfractures, corrosion, and other defects that can impact the performance and reliability of your materials.

Applications

  • Semiconductor device inspection
  • Failure analysis and quality control
  • Nanomaterials and coatings
  • Geology and mineralogy
  • Biomaterials and life sciences

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