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Electron, Ion, and Probe Microscopy
Hitachi Microscopy and Microanalysis Webinar Series

Hitachi Microscopy and Microanalysis Webinar Series

Microscopy & Microanalysis WEBINAR SERIES

Hitachi High-Tech America’s Microscopy Webinar Series provides extensive insight of today’s microscopy and microanalysis solutions and technologies.

Both live and on-demand webinars are available. If you wish to be informed of our upcoming webinars, contact Nanotechnology Systems Division at hta-microscopy@hitachi-hightech.com.

SEM
TEM/STEM
FIB-SEM
Sample Preparation
AFM

On-Demand Webinars

SEM

Creating An End-to-End Solution for Electron Microscopy Visualization & Analysis
(52 min)

Hitachi-Bruker Virtual Mini-Workshop: Building Bridges from Micro to Nano Scale Analysis
(137 min)

See STEM in a New Light: Introducing Hitachi’s New UVD-STEM Solution
(24 min)

SEM Surface Analysis Made Easy
(48 min)

Next-Generation SEM Platform for Next-Generation Microscopists
(26 min)

New Hitachi Regulus Cold Source FE-SEM—Resolution, Stability, and Power
(40 min)

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TEM/STEM

An Evolutionary Era of 120 kV TEM: New Technologies, Digital Designs, Automation, Sample Prep, and More!
(33 min)

A New Era in Microscopy: The Analytical STEM/SEM at ≤ 30 keV is kicking the higher kV microscopes out of the game
(53 min)

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FIB-SEM

Segmentation Series Part 1: Fusing the Pieces of FIB-SEM Data
(60 min)

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Sample Preparation

An Evolution in Sample Preparation by the Application of Broad Ion Milling
(43 min)

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AFM

SÆMic.: A Complete Solution for Correlative AFM-SEM Analysis
(47 min)

Enhanced AFM Measurements with Hitachi Innovative Sampling Intelligent Scan
(27 min)

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