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Electron, Ion, and Probe Microscopy
Hitachi Microscopy and Microanalysis Webinar Series

Hitachi Microscopy and Microanalysis Webinar Series

Microscopy & Microanalysis WEBINAR SERIES

Hitachi High-Tech America’s Microscopy Webinar Series provides extensive insight of today’s microscopy and microanalysis solutions and technologies.

For the past webinars, recordings are available. If you wish to be informed of our upcoming webinars, contact Nanotechnology Systems Division at microscopy@hitachi-hta.com.

SEM
TEM/STEM
Sample Preparation
AFM

Recorded Webinars

SEM

Creating An End-to-End Solution for Electron Microscopy Visualization & Analysis
(52 min)

Hitachi-Bruker Virtual Mini-Workshop: Building Bridges from Micro to Nano Scale Analysis
(137 min)

See STEM in a New Light: Introducing Hitachi’s New UVD-STEM Solution
(24 min)

SEM Surface Analysis Made Easy
(48 min)

Next-Generation SEM Platform for Next-Generation Microscopists
(26 min)

New Hitachi Regulus Cold Source FE-SEM—Resolution, Stability, and Power
(40 min)

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TEM/STEM

An Evolutionary Era of 120 kV TEM: New Technologies, Digital Designs, Automation, Sample Prep, and More!
(33 min)

A New Era in Microscopy: The Analytical STEM/SEM at ≤ 30 keV is kicking the higher kV microscopes out of the game
(53 min)

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Sample Preparation

An Evolution in Sample Preparation by the Application of Broad Ion Milling
(43 min)

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AFM

SÆMic.: A Complete Solution for Correlative AFM-SEM Analysis
(47 min)

Enhanced AFM Measurements with Hitachi Innovative Sampling Intelligent Scan
(27 min)

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