Skip to main content

Hitachi

Science & Medical SystemsHitachi High-Technologies

Atomic Force Microscope (AFM) / Contac Mode

For contact mode AFM, the force between probe and sample is detected and measured via cantilever’s deflection. A feedback system will maintain this deflection constant while scanning the sample surface to observe topography.

Semiconductor circuit
Scan area: 100 µm

Langmuir‐Blodgett film
Animation of AFM Observation: Langmuir‐Blodgett film