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Dynamic Force Microscope (DFM)

For DFM, the cantilever is oscillating while it approaches to the sample surface. The force between probe and sample is reflected by cantilever amplitude change and maintained to be constant while scanning and observing the sample surface.

Dendrite
Scan area: 30 µm

Pentacene
Animation of DFM Observation: Pentacene

Sample provided by Kitamura Laboratory, Kobe University
Sample provided by Kitamura Laboratory, Kobe University