This is a Large Angle Convergent Beam Electron Diffraction (LACBED) pattern observed along Si (111) zone axis. Convergent electron beam produces such beautiful geometrical patterns formed by perfect atomic arrangement. Could you call it a "CREST of material"?
At 58th photo contest hosted by the Japanese Society of Electron Microscopy in 2002.
Specimen: Si single crystal
Instrument: Transmission Electron Microscope H-9000NAR
Accelerating voltage: 200 kV
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*This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
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